OU77-FY26-023-NEW SCANNING ELECTRON MICROSCOPY (SEM) IMAGE ANALYSES USING ARTIFICIAL INTELLIGENCE (AI) MODELING FOR OVERLAY SEM METROLOGY

COMMERCE, DEPARTMENT OF — NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY

Share:

Award Amount

$141,746

Potential: $238,911

Period of Performance

2026-02-12 — 2027-10-11

Classification

NAICS: 541519PSC: DD01

OTHER COMPUTER RELATED SERVICES

Place of Performance

GAITHERSBURG, MD

Recipient

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Description

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Source: sam_awards · ID: 1333ND26FNB770012